In the race to build ever smaller and more complex computer chips, one of the most stubborn enemies is not the transistor ...

In quantum metrology, it has been considered for some time whether quantum error correction can be used to enhance precision measurements. Here, the primary challenge ...

Overlay is one of the most critical process control steps of semiconductor manufacturing technology. A typical advanced scheme includes an overlay feedback loop based on after litho optical imaging ...

Chipmakers face a multitude of challenges in the fab at 10nm/7nm and beyond, but one technology that is typically under the radar is becoming especially difficult—metrology. Metrology, the art of ...

Charlotte, NC, June 5, 2026 – F. D. Hurka Metrology, a Charlotte, North Carolina-based precision measurement distributor and ISO/IEC 17025-accredited calibration service provider, has published a ...

Metrology serves as the cornerstone of modern industry, providing the key standards by which we measure the world. Optical metrology, in particular, has historically leveraged the notion of ...

In this article, Almir Jakupovic, sales director at norelem, discusses how modular clamping systems provide engineers with an adaptable, efficient, and sustainable solution to meet the demands of high ...

As we move through 2025, the convergence of metrology and additive manufacturing (AM) is not merely a technological evolution; it is a paradigm shift poised to redefine the competitive landscape of ...

Coordinate metrology is used by designers, engineers, and manufacturers to accurately gauge the characteristics of mechanical components. Coordinate measuring machines (CMMs) can make comparisons of ...