A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.

For semiconductor manufacturers entering the automotive environment, the lack of universal qualifications standards often leads to inconsistent reliability expectations. The most efficient solution is ...

Environmental and qualification testing play a critical role in this process. As device geometries shrink and packaging technologies become more complex, environmental stress testing provides a ...

STAr Technologies, a leader in parametric and reliability test systems today has launched STAr Pluto series tester to meet test needs for both Package- and Wafer-level reliability test systems. This ...

STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...